Skip to main navigation
Skip to page content
Student Focused
Land Grant
Research University
Search Term
Submit
Show
Search
Electron Microscopy Core
Mobile menu
Services
Instrument Usage Rates
Acknowledgments
How to Submit Samples
Instrumentation
MicroCT: GE v|tome|x s
SEM: JEOL JSM-7600F
SEM: JEOL JSM-6490LV
SEM: JEOL JSM-IT200LA
TEM: JEOL JEM-2100
TEM: JEOL JEM-1400 Flash
Cross Section Polisher: JEOL IB09010CP
Tensile Stage: Deben MICROTEST
Facility
Location
Access
History
People
Contact
Images
SEM Images
3-D Images
NDSU
Electron Microscopy Core
Images
3-D Images
Mosquito
×
Previous
Next
Top of page