Electron Microscopy and Nondestructive Inspection
Microcomputed Tomography
GE Inspection Technologies v|tome|x s 240kV microfocus X-ray computed tomography system with additional 180kV HPNF submicron X-ray tube (nanoCT) and high-contrast digital flat panel detector
The microCT system enables external and internal evaluation of intact objects, not otherwise possible without permanent damage. Like computed tomography (“CAT scanning”) in human medicine, microCT equipment acquires successive radial X-ray images of an object. Then sophisticated software in a powerful computer workstation manipulates the images to provide tremendous detail: digital 3D reconstruction, exterior and interior measurements, porosity analysis, defect inspection, and surface rendering for finite element analysis and 3D printing. This type of nondestructive testing technology has wide-ranging research and commercial applications.
National Science Foundation (NSF) Division of Biological Infrastructure Award #1229417
Transmission Electron Microscopy and Microanalysis
- JEOL JEM-1400 Flash cryo-capable transmission electron microscope
- JEOL JEM-2100 analytical transmission electron microscope
Scanning Electron Microscopy and Microanalysis
- JEOL JSM-6490LV variable-pressure scanning electron microscope system
- Noran System SIX X-ray microanalysis system with Thermo Scientific UltraDry EDS detector for the JSM-6490LV SEM
- JEOL JSM-7600F analytical high-resolution field-emission scanning electron microscope
- Noran System 7 X-ray microanalysis system with UltraDry series detector, NORVAR 30 mm2 light-element window
- JEOL JSM-IT200LA compact user-friendly scanning electron microscope with JEOL EDS analysis
Sample Preparation and Ancillary Equipment
- Cross Section Polisher, JEOL IB09010CP
- Dimple Grinder GATAN model 656
- GATAN Precision Ion Polishing System
- Ultrasonic Cutter GATAN Model 601
- Disc Grinder GATAN Model 623
- RMC MTXL Ultramicrotome
- Cryoultramicrotome: RMC Powertome XL with CR-X crysectioning system
- 2 sputter coaters for metallic conductive coating of SEM samples
- Carbon coater, high-vacuum, Cressington 208C Turbo
- Critical-point Drier, Tousimis autosamdri®-810
- Precision saw, Buehler IsoMet 1000
- Tensile stage, Deben MICROTEST
Secure digital imaging, storage, retrieval, and sharing capabilities
All of our instruments are in climate-controlled, vibration-isolated rooms for best performance.
Additional characterization (XRD, XPS, NMR, and others) available through NDSU's Core Research Services.